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主管：中华人民共和国司法部
主办：司法鉴定科学研究院
ISSN 1671-2072 CN 31-1863/N
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Chinese Journal of Forensic Sciences
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中文
The Metallographic Structure Analysis of the Secondary Short Circuit-Caused Melted Trace Based on Digital Image Technology #br#
MO Shan-jun, PENG Wen-jing, LONG Yu-tao
Chinese Journal of Forensic Sciences . 2012, (
4
): 107 -111 .
