集成电路知识产权保护及司法鉴定探讨

›› 2007 ›› Issue (1): 36-39.

集成电路知识产权保护及司法鉴定探讨

王桂海;罗苏平;

华南师范大学计算机学院,华南师范大学计算机学院广东广州510631,广东广州510631

出版日期:2007-01-15

Protection and Forensic Evaluation of Intellectual Property of Integrated Circuits

WANG Gui-hai, LUO Su-ping (South China Normal University, Guangzhou 510631, China)

Published:2007-01-15

摘要/Abstract

摘要： 对我国的集成电路布图设计采用专门法保护进行了讨论,并结合司法鉴定案例,对原创性和相似性比较进行分析。

关键词: 集成电路, 布图设计, 知识产权, 司法鉴定

Abstract: The protection of layout designs of integrated circuits by special law in China is discussed. A case of infringement is presented to demonstrate the comparison of originality and similarity of integrated circuits.

Key words: integrated circuit, layout-design, intellectual property, forensic evaluation

王桂海;罗苏平;. 集成电路知识产权保护及司法鉴定探讨[J]. , 2007(1): 36-39.

WANG Gui-hai;LUO Su-ping (South China Normal University;Guangzhou 0;China). Protection and Forensic Evaluation of Intellectual Property of Integrated Circuits[J]. , 2007(1): 36-39.

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